| 在ADCs设计中，准确地知道其动态行为的特征参数非常重要。本书讨论了三种典型的测试ADCs的动态性能的方法，也给出了另外一种测试方法，这种方法避免了典型方法的限制。动态特性是衡量ADC性能的决定性指标之一，本书给出了测试方法、影响动态特性的因素以及解决方案。 |
| Preface Introduction Jose Machado da Silva Glossary Part I ADC Characterisation Based on Sinewave Analysis 1 ADC Applications, Architectures and Terminology Jose Machado da Silva, Helio Mendonga 1.Introduction 2.ADCs' applications 3.ADCs' architectures 4.Terminology 5.Quantisation and A/D conversion 6.Output coding 7.Errors, non-linearity, noise, and distortion 8.Data acquisition and processing 9.Input characteristics 2 Sinewave Test Setup Pierre-Yves Roy, Jacques Durand 1.Test Setup description 2.Specification of the clock and input signal 3.Example of filter specification 4.Filter selection 5.Taking a record of data 3 Time-Domain Data Analysis Dominique Dallet, Djamel Haddadi, Philippe Marchegay 1.Introduction 2.Calculation of the dynamic parameters 3.Definitions 4.The fixed-frequency method 5.The four-parameter method 6.Definitions of THD and SNR 7.The multi-harmonic sine-wave fitting method 8.Estimation of the normalised angular frequency 9.Estimation of the linear parameters 10.On the rank of Ep 11.The algorithm 12.Multitone test to circumvent signal purity problems 4 Frequency-Domain Data Analysis Pierre- Yves Roy, Jacques Durand 1.Discrete Fourier Transform and Fast Fourier Transform 2.Choice of input and clock frequencies 3.Windowing 4.Comment on the accuracy of the input frequency 5.Record size 6.Calculation of ADC dynamic parameters in the frequency domain 5 Code Histogram Test Giovanni Chiorboli, Carlo Morandi 1.Introduction 2.The sampling strategy and its contribution to count variance and measurement uncertamty 3.Additional contributions to count uncertainty: additive noise andjitter 4.Factors affecting the p.d.f, of the input signal 5.Required record length and number of records, expression of mea-surement uncertainty 6.Choice of the coverage factor 7.Comparing the number of samples required by random and by syn-chronous sampling. 8.Determining the transfer characteristic 9.Offset error and gain 10.Linearity errors 11.Appendix 6 Comparative Study of ADC Sinewave Test Methods JoseMachado da Silva, Helio Mendonga, Sara Mazoleni 1.Introduction 2.General considerations 3.Simulation results 4.ATE Implementation 5.Conclusions Part II Measurement of Additional Parameters 7 Jitter Measurement Pierre-Yves Roy, Jacques Durand 1.Introduction 2.The double beat technique 3.The joint probability technique 4.Conclusion 8 Differential Gain and Phase Testing JoseMachado da Silva, Helio Mendonga 1.Introduction 2.Test setup and hardware requirements 3.Analysis 4.Test results 5.Calculation of differential gain and phase from the test results 9 Step and Transient Response Measurement Giovanni Chiorboli, Carlo Morandi 1.Introduction 2.Settling time and transition duration of step response 3.Frequency response measurement 10 Hysteresis Measurement Giovanni Chiorboli Carlo Morandi 1.Introduction 2.Test conditions 3.A practical case 4.Collection of samples in HC↑ and HC↓ 5.Some warning References Index |
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