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Nyquist A/D Converters, Sensor Interfaces, and Robustness

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Nyquist A/D Converters, Sensor Interfaces, and Robustness

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出版时间:2012年9月28日

I S B N:9781461445869

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Part I: Nyquist A/D Converters.- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes.- A 12-bit 800MS/s Dual Residue Pipeline ADC.- Time-Interleaved SAR and Slope Converters.- GS/s AD Conversion for Broadband Multi-Stream Reception.- CMOS Ultra High-Speed Time-Interleaved ADCs.- CMOS ADCs for Optical Communications.- Part II: Capacitive Sensor Interfaces.- Motion MEMS and Sensors, Today and Tomorrow.- Capacitive Interface Electronics for Sensing and Actuation.- Energy-Efficient Capacitive Sensor Interfaces.- Interface Circuits for MEMS Microphones.- Continuous-Time Delta-Sigma Modulators for Closed-Loop Readout of Capacitive MEMS Gyroscopes.- Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments.- Part III: Robustness.- How Can Chips Live Under Radiation?.- Radiation-Tolerant MASH Delta-Sigma Time-to-Digital Converters.- A Designer's View on Mismatch.- Analog Circuit Design in Organic Thin-Film Transistor Technologies on Foil: An Overview.- Impact of Statistical Variability on Finfet Technology: From Device, Statistical Compact Modeling to Statistical Circuit Simulation.

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