目录Atomistic simulations of reliability.- Physical mechanisms of aging effects.- Noise and aging effects.- Radiation effects.- Compact modeling of device and circuit reliability.- On-chip characterization of circuit reliability.- Circuit resilience roadmap.- Circuit layout for reliability.- Robust memory design under variation and aging effects.- Reliable design under low-frequency noise.- Variability Aware Clock Design.- Radiation Tolerance Techniques.- Thermal effects compensation.- Scaling trends and conclusion. |
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