Nanometer Variation-tolerant SRAM Statistical Design for Yield

Introduction.- Variability in Nanometer Technologies and Impact on SRAM.- Variarion-Tolerant SRAM Write and Read Assist Techniques.- Reducing SRAM Power using Fine-Grained Wordline Pulse Width Control.- A Methodology for Statistical Estimation of Read Access Yield in SRAMs.- Characterization of SRAM Sense Amplifier Input Offset for Yield Prediction.