| “透射电子显微学”这门课程所用的教科书有许多种。本书为全英文版，是美国最为流行的教科书之一。本书分基本概念，衍射理论，成像原理以及能谱分析四卷。其中第1卷主要讲解电子显微镜的基本概念；第2卷介绍衍射图像、倒易点阵、衍射电子像的标定，以及各种衍射分析方法；第3卷主要是关于成像原理，该卷对材料研究中典型的课题进行系统的介绍；第4卷讨论各种能谱的分析方法与技术。 本书不仅可以在国内科技英文教学方面作为一个具有国际工程院系的教学标准，也为一般的大专院校和科技单位的研究工作提供了一本内容丰富、机具科研价值的参考书。 |
| Ⅰ Basics 1 The Transmission Electron Microscope 2 Scattering and Diffraction 3 Elastic Scattering 4 Inelastic Scattering and Beam Damage 5 Electron Sources 6 Lenses,Apertures,and Resolution 7 How to“See”Electrons 8 Pumps and Holders 9 The Instrument 10 Specimen Preparation Ⅱ Diffraction 11 Diffraction Patterns 12 Thinking in Reciprocal Space 13 Diffracted Beams 14 Bloch Waves 15 Dispersion Surfaces 16 Diffraction from Crystals 17 Diffraction from Small Volumes 18 Indexing Diffraction Patterns 19 Kikuchi Diffraction 20 Obtaining CBED Patterns 21 Using Convergent-Beam Techniques Ⅲ Imaging 22 Imaging in the TEM 23 Thickness and Bending Effects 24 Planar Defects 25 Strain Fields 26 Weak-Beam Dark-Field Microscopy 27 Phase-Contrast Images 28 High-Resolution TEM 29 Image Simulation 30 Quantifying and Processing HRTEM Images 31 Other Imaging Techniques Ⅳ Spectrometry 32 X-ray Spectrometry 33 The XEDS-TEM Iterface 34 Qualitative X-ray Analysis 35 Qualitative X-ray Microanalysis 36 Spatial Resolution and Minimum Detectability 37 Electron Energy-Loss Spectrometers 38 The Energy-Loss Spectrum 39 Microanalysis with lonization-Loss Electrons 40 Everything Else in the Spectrum |
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